Embedded

Understanding the Impact of Single Event Effects in Networking Applications

Reliability of communication is essential in networking applications. The goal of five nines (99.999%) in network availability translates to less than six minutes in downtime in a year for the entire network. Among the many impacts on system reliability are the effects of ionizing radiation on electronic circuits. This radiation can cause memory elements in electronic circuits to change state. When this happens in the configuration memory of SRAM-based FPGAs, it can cause a change in the functionality of the circuit, greatly impacting system reliability. Designers of networking applications must understand the effect of this radiation and how to reduce the risk to the network.

Want to Read More? Please Sign In

If you have already registered with us, you can sign in here to access this content. If not, register now and get full access to our entire On Demand library of webcasts, white papers and more. Registration is free. Click Here to Register


 
    submit to reddit  

Comments:

You must be logged in to leave a reply. Login »

Full Whitepaper Available for Download

If you already have registered with us, Sign In Here

Not a member yet? Register now!

It's free and will give you access to this and our entire collection of webcasts, videos, whitepapers and more. Register Now

Sign In  Register

Recent Article Mentions

Das Boot und Kryptographie

Microsemi Inserts Man-in-the-Middle to Encrypt Boot-up

Proliferating Programmability in 2014

Forecasting the FPGA Future

Sheep’s Clothing

Can FPGAs Pass as Processors?

IGLOO2 to You Too

Building a Bigger Better Igloo

Microsemi Goes Mainstream


Login Required

In order to view this resource, you must log in to our site. Please sign in now.

If you don't already have an acount with us, registering is free and quick. Register now.

Sign In    Register